Chris Palenik Presents at the American Academy of Forensic Sciences Meeting



The American Academy of Forensic Sciences (AAFS) held their 70th Annual Meeting in Seattle, Washington from February 19 to 23, 2018. Microtrace Senior Research Microscopist Chris Palenik gave two oral presentations and co-taught a workshop at the conference. Chris opened the week by chairing a workshop on Raman spectroscopy in trace evidence examinations on Monday morning. In the following days he spoke on the forensic application of fulgurites (amorphous silica produced as a result of high temperature/pressure) and on the analysis of nano- and other subvisible particles.

The abstracts for Chris’s presentations can be found here: Raman spectroscopy, fulgurites, and nanoparticles.

American Academy of Forensic Sciences

The American Academy of Forensic Sciences is a multi-disciplinary professional organization that provides leadership to advance science and its application to the legal system. The objectives of the Academy are to promote professionalism, integrity, competency, education, foster research, improve practice, and encourage collaboration in the forensic sciences.

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