Nano- to Atomic Scale Imaging of Heavy Trace Metals Utilizing Advanced Microscopy Techniques

Utsunomiya, S., Palenik, C.S., and Ewing, R.C. (2004) Nano- to Atomic Scale Imaging of Heavy Trace Metals Utilizing Advanced Microscopy Techniques . The Dekker Encyclopedia of Nanoscience and Nanotechnology Marcel Dekker Pub., NY ISBN:978-0824750558).

Published on: 4/30/2004

Share Button

How May We Help You?

Contact us to discuss your project in more detail.